Vertical Boring & Turning Mill TDS Machine
TDS series is used to manufacture large diameter and heavy work pieces with exceptional accuracy and productivity
Swing/Cut - Metric (mm)
Cut Height - Metric (mm)
Z Stroke - Metric (mm)
Table Size - Metric (mm)
Max Load - Metric (Kgs)
|Swing/Cut inch(mm)||157.5 (4000)|
|Cut Height inch(mm)||98.4 (2500)|
|X Stroke inch(mm)||-80.7 ~ 84.6 (-2050 ~ 2150)|
|Z Stroke inch(mm)||59.0 (1500)|
|ARM/Crossrail Vertical Travel Not NC-Axis inch(mm)||68.9 (1750)|
|TABLE size inch(mm)||118.1 (3000)|
|Max. load lbs(kg)||66000 (30000)|
|ATC Tool Pod||24|
RAM-type Spindle Head (Attachment change capable)
The thick, 14.96”-square (380mm-square), ram is hardened and ground with high accuracy on straightness, squareness and parallelism.
393 ipm (10,000 mm/min) X, Y and Z-axes Feed Rate
With a maximum feedrate of 393 ipm (10,000mm/min) for high-speed axis feed, actual idle time is minimized for greatly improved productivity.
10,000 RPM High Speed Spindle, Big Plus
High-speed spindle head AC 35/20 HP, 40 ~ 10,000 RPM
Spindle Head cooling unit
Use of highly effective spindle head cooling unit for stabilized high accuracy cutting operations.
Z-axis thermal displacement compensation function (Optional)
This function monitors the spindle temperature and compensate value of Z-axis coordinates.
Direct Table Change type Automatic Workpiece Changer (DTC/AWC) (Optional)
For the conventional APC (pallet changer), pallet loading in layers on the pallet base were transferred. This MPF series machine allows the table to directly ride on the machine bed to increase the machine rigidity and accuracy.
SHAPE recognition preview control function (CNC SHAPE) (Optional)
Shape recognition preview positioning control (CNC shape II). Target are accurate shape and smooth surface in contouring surface machining.
Automatic measuring RENISHAW probe (Optional)
This unit consists of a radio touch probe made by Renishaw, a standard measuring software designed by Shibaura Machine and calibration block for checking compensation value of touch probe.